The dielectric behavior of outdoor high-voltage polymeric insulation due to environmental aging

authored by

M. Ehsani, G. R. Bakhshandeh, J. Morshedian, H. Borsi, E. Gockenbach, A. A. Shayegani

Abstract

Most of breakdowns are caused by aging effects of high-voltage insulation used within these components, and there is still a need of suitable tools to diagnose such systems non-destructively and reliably in the field. Several methods have been published in the last decade for which reliable diagnostics are claimed. One of these methods is based on changes of the dielectric properties of the insulation. Dielectric spectroscopy provides information on molecular dynamics and free charge carriers and it is sensitive to the insulation morphology, that is crystallinity, oxidation, additives, and impurities (ions and dipolar molecules). The measurement of dielectric constants and dielectric losses in frequency domain help to quantify the chemical and physical changes in the bulk of polymer due to aging. The results of frequency domain measurements in this contribution show that the effects of aging of insulators can be analyzed by this method. This paper demonstrates the use of a dielectric spectroscopy technique for monitoring the effect of different aging on silicone rubber, ethylene-propylene diene monomer (EPDM), and blend of silicone-EPDM and new polymeric alloy. New polymeric alloy is found to be suitable for humid environment and shows good hydro-thermal resistance compared to other polymers; also it is cheaper than other materials.

Organisation(s)

High Voltage Engineering and Asset Management Section (Schering Institute)

External Organisation(s)

Iran Polymer and Petrochemical Institute
University of Tehran

Type

Article

Journal

European Transactions on Electrical Power

Volume

17

Pages

47-59

No. of pages

13

ISSN

1430-144X

Publication date

01.2007

Publication status

Published

Peer reviewed

Yes

ASJC Scopus subject areas

Energy Engineering and Power Technology, Electrical and Electronic Engineering

Electronic version(s)

https://doi.org/10.1002/etep.119 (Access: Unknown)