The dielectric behavior of outdoor high-voltage polymeric insulation due to environmental aging

verfasst von

M. Ehsani, G. R. Bakhshandeh, J. Morshedian, H. Borsi, E. Gockenbach, A. A. Shayegani

Abstract

Most of breakdowns are caused by aging effects of high-voltage insulation used within these components, and there is still a need of suitable tools to diagnose such systems non-destructively and reliably in the field. Several methods have been published in the last decade for which reliable diagnostics are claimed. One of these methods is based on changes of the dielectric properties of the insulation. Dielectric spectroscopy provides information on molecular dynamics and free charge carriers and it is sensitive to the insulation morphology, that is crystallinity, oxidation, additives, and impurities (ions and dipolar molecules). The measurement of dielectric constants and dielectric losses in frequency domain help to quantify the chemical and physical changes in the bulk of polymer due to aging. The results of frequency domain measurements in this contribution show that the effects of aging of insulators can be analyzed by this method. This paper demonstrates the use of a dielectric spectroscopy technique for monitoring the effect of different aging on silicone rubber, ethylene-propylene diene monomer (EPDM), and blend of silicone-EPDM and new polymeric alloy. New polymeric alloy is found to be suitable for humid environment and shows good hydro-thermal resistance compared to other polymers; also it is cheaper than other materials.

Organisationseinheit(en)

Fachgebiet Hochspannungstechnik und Asset Management (Schering-Institut)

Externe Organisation(en)

Iran Polymer and Petrochemical Institute
University of Tehran

Typ

Artikel

Journal

European Transactions on Electrical Power

Band

17

Seiten

47-59

Anzahl der Seiten

13

ISSN

1430-144X

Publikationsdatum

01.2007

Publikationsstatus

Veröffentlicht

Peer-reviewed

Ja

ASJC Scopus Sachgebiete

Energieanlagenbau und Kraftwerkstechnik, Elektrotechnik und Elektronik

Elektronische Version(en)

https://doi.org/10.1002/etep.119 (Zugang: Unbekannt)