Impact of multistress aging on the dielectric relaxation behaviour of XLPE cable insulation

verfasst von

M. Reuter, E. Gockenbach, H. Borsi

Abstract

This contribution reports on experimental investigations dealing with the impact of different combined aging parameters like electrical field strength, conductor temperature, and test duration on the dielectric relaxation behaviour of full-sized model cables with cross-linked polyethylene insulation. The evaluation of time-domain isothermal depolarisation current measurements turns out that characteristic properties of a third order exponential decay function exhibit different trends depending on the nature of the various aging factors.

Organisationseinheit(en)

Fachgebiet Hochspannungstechnik und Asset Management (Schering-Institut)

Typ

Aufsatz in Konferenzband

Band

1

Seiten

339-342

Anzahl der Seiten

4

Publikationsdatum

2004

Publikationsstatus

Veröffentlicht

Peer-reviewed

Ja

ASJC Scopus Sachgebiete

Allgemeiner Maschinenbau